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Characterisation
The characterisation facility consists of a range of modern instruments dedicated to the characterisation of novel 2D materials. Techniques include atomic force microscopy for force measurements and imaging. AFM-IR combining atomic force microscopy and infrared spectrophotometry, scanning electrochemical microscopy used to measure the local electrochemical behaviour of liquid/solid, liquid/gas and liquid/liquid interfaces, thermal diffusivity, drop shape analyser for the measurement of surface wetting and adhesion and physical adsorption of gas molecules on a solid surface.